JPH01124580U - - Google Patents
Info
- Publication number
- JPH01124580U JPH01124580U JP1952588U JP1952588U JPH01124580U JP H01124580 U JPH01124580 U JP H01124580U JP 1952588 U JP1952588 U JP 1952588U JP 1952588 U JP1952588 U JP 1952588U JP H01124580 U JPH01124580 U JP H01124580U
- Authority
- JP
- Japan
- Prior art keywords
- pallet
- socket
- laser diode
- cylindrical shafts
- holes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000017525 heat dissipation Effects 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988019525U JPH079109Y2 (ja) | 1988-02-17 | 1988-02-17 | レーザダイオードの測定用治具 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988019525U JPH079109Y2 (ja) | 1988-02-17 | 1988-02-17 | レーザダイオードの測定用治具 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01124580U true JPH01124580U (en]) | 1989-08-24 |
| JPH079109Y2 JPH079109Y2 (ja) | 1995-03-06 |
Family
ID=31235112
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1988019525U Expired - Lifetime JPH079109Y2 (ja) | 1988-02-17 | 1988-02-17 | レーザダイオードの測定用治具 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH079109Y2 (en]) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2008153178A1 (ja) * | 2007-06-14 | 2008-12-18 | Chichibu Fuji Co., Ltd. | 半導体レーザ用エージングボード |
| JP2010122181A (ja) * | 2008-11-21 | 2010-06-03 | Daitron Technology Co Ltd | 押さえ板及びそれを用いた検査装置 |
| JP2010122182A (ja) * | 2008-11-21 | 2010-06-03 | Daitron Technology Co Ltd | 検査治具及び検査装置 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58158372U (ja) * | 1982-04-19 | 1983-10-22 | 日本電気株式会社 | 半導体装置の測定治具 |
-
1988
- 1988-02-17 JP JP1988019525U patent/JPH079109Y2/ja not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58158372U (ja) * | 1982-04-19 | 1983-10-22 | 日本電気株式会社 | 半導体装置の測定治具 |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2008153178A1 (ja) * | 2007-06-14 | 2008-12-18 | Chichibu Fuji Co., Ltd. | 半導体レーザ用エージングボード |
| JP5292290B2 (ja) * | 2007-06-14 | 2013-09-18 | 株式会社秩父富士 | 半導体レーザ用エージングボード |
| JP2010122181A (ja) * | 2008-11-21 | 2010-06-03 | Daitron Technology Co Ltd | 押さえ板及びそれを用いた検査装置 |
| JP2010122182A (ja) * | 2008-11-21 | 2010-06-03 | Daitron Technology Co Ltd | 検査治具及び検査装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH079109Y2 (ja) | 1995-03-06 |